Research to the Typical Defects of Crystalline ...
URL: http://www.ijesci.org/paperInfo.aspx?ID=7791
According to the electroluminescent imaging mechanism of crystalline silicon photovoltaic cells, EL images of four kinds of the typical defects that happened with high frequency in the course of the production in crystalline silicon photovoltaic cells, such as, black core, cracks, broken gate and over welding, etc, were analyzed with some emphasis in this articleon the aspects ofthe characteristic, production mechanism, harm and resolution of those images, then the solution to defects is applied to productive practice of Yingli , indicating its availability in its performance, which would help us make better use of the detected EL images in production practices by means of the rapid and accurate recognization on various defects,in order to impel the development of production technology and enhance the benefits.
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Last updated | unknown |
Created | unknown |
Format | url |
License | Other (Open) |
Created | over 12 years ago |
format | url |
id | 9949249b-eb15-4780-961d-117724e584f3 |
package id | f9509328-2cfc-45aa-b738-31ec0c304569 |
position | 102 |
resource type | file |
revision id | 00a05929-ea33-4718-abe3-ae4766ee7f9c |
state | active |